VLSI System Testing (3 – 0 - 0) 3


·    To expose the students, the basics of testing techniques for VLSI circuits and Test Economics.



Basics  of  Testing:  Fault  models,  Combinational  logic  and  fault  simulation,  Test  generation  for Combinational Circuits. Current sensing based testing. Classification of sequential ATPG methods. Fault collapsing and simulation.

Universal test sets: Pseudo-exhaustive and iterative logic array testing. Clocking schemes for delay fault testing. Testability classifications for path delay faults. Test generation and fault simulation for path and gate delay faults.

CMOS testing: Testing of static and dynamic circuits. Fault diagnosis: Fault models for diagnosis, Cause- effect diagnosis, Effect-cause diagnosis.

Design for testability: Scan design, Partial scan, use of scan chains, boundary scan, DFT for other test objectives, Memory Testing.

Built-in self-test: Pattern Generators, Estimation of test length, Test points to improve testability, Analysis of aliasing in linear compression, BIST methodologies, BIST for delay fault testing.


Text Books

1.   N. Jha & S.D. Gupta, “Testing of Digital Systems”, Cambridge, 2003.

2.   W. W. Wen, “VLSI Test Principles and Architectures Design for Testability”, Morgan Kaufmann

Publishers. 2006

Reference Books

1.   Michael L. Bushnell &Vishwani D. Agrawal,” Essentials of  Electronic Testing for Digital, memory

& Mixed signal VLSI Circuits”, Kluwar Academic Publishers. 2000.

2.   P. K. Lala,” Digital circuit Testing and Testability”, Academic Press. 1997.

3.   M. Abramovici, M. A. Breuer, and A.D. Friedman, “Digital System Testing and Testable Design”,

Computer Science Press, 1990.



Students are able to

CO1: apply the concepts in testing which can help them design a better yield in IC design. CO2: tackle the problems associated with testing of semiconductor circuits at earlier design

levels so as to significantly reduce the testing costs.

CO3: analyse the various test generation methods for static & dynamic CMOS circuits.

CO4: identify the design for testability methods for combinational & sequential CMOS circuits. CO5: recognize the BIST techniques for improving testability.