MT405
Material Characterisation
The metallurgical microscope, phase contrast polarized light and interference microscopy; high-temperature microscopy, quantitative metallography, specimen preparation techniques
Continuous and characteristic X-radiation; Bragg's law and X-ray diffraction, determination of lattice parameter, phase identification/quantification, solvus line determination, and residual stress measurement
Construction of scanning electron microscope, modes of operation, study of surface topography and elemental composition analysis, electron probe analysis (EPMA/EDX), and Auger spectroscopy
Constructional feature of transmission electron microscope, imaging and diffraction modes, bright and dark field imaging, selected area diffraction, specimen preparation techniques
Thermal analysis, dilatometry, resistivity and magnetic measurements. methods of growing single crystals
TEXT BOOKS
1. Small man R.E., ‘Modern Physical Metallurgy’, 4th Edition, Butterworths, 1985
2. Philips V.A., ‘Modern Metallographic Techniques and Their Applications’, Wiley Interscience, 1971
REFERENCES
1. Cullity B.D., ‘Elements of X-ray Diffraction’, 4th Edition, Addison Wiley, 1978
2. Weinberg F., ‘Tools and Techniques in Physical Metallurgy, Volume I and II, Marcel and Decker, 1970
3. Giflin R.C., Optical Microscopy of Metals’, Isaac Pitman, 1970