MT405

Material Characterisation

 

L

T

P

C

3

0

0

3

 

 

 

 

 

 

The metallurgical microscope, phase contrast polarized light and interference microscopy; high-temperature microscopy, quantitative metallography, specimen preparation techniques

 

Continuous and characteristic X-radiation; Bragg's law  and X-ray  diffraction, determination of lattice parameter, phase identification/quantification, solvus line determination, and residual stress measurement

 

Construction of  scanning electron microscope, modes of operation, study of surface topography and elemental composition analysis, electron probe analysis (EPMA/EDX),  and Auger spectroscopy

 

Constructional  feature  of  transmission   electron microscope, imaging and diffraction modes, bright and dark  field imaging,  selected area diffraction, specimen   preparation techniques

 

 

Thermal  analysis,  dilatometry,  resistivity  and  magnetic measurements.    methods of growing single crystals

TEXT BOOKS

 

1.       Small man R.E., ‘Modern Physical Metallurgy’,  4th Edition, Butterworths, 1985

2.       Philips V.A., ‘Modern Metallographic Techniques and Their Applications’, Wiley Interscience, 1971

 

REFERENCES

 

1.             Cullity B.D., ‘Elements of X-ray Diffraction’, 4th Edition, Addison Wiley, 1978

2.             Weinberg F., ‘Tools and Techniques in Physical Metallurgy, Volume I and II, Marcel and Decker,                 1970

3.             Giflin R.C., Optical Microscopy of Metals’, Isaac Pitman,  1970